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  1. Pubblicazioni

A single quality factor for electron backscattering from thin films

Articolo
Data di Pubblicazione:
1995
Citazione:
A single quality factor for electron backscattering from thin films / A., P., Santangelo, S., A., T.. - In: MICROELECTRONIC ENGINEERING. - ISSN 0167-9317. - 27:1-4(1995), pp. 183-186. [10.1016/0167-9317(94)00085-9]
Abstract:
In this paper, Buckingham's theorem on physically similar systems is applied for the first time to the derivation of interpolation curves of numerical data. A simplified dependence of the curves on a limited number of effective dimensionless parameters is found by a novel approach. In particular, the method is applied to Monte Carlo modelling and the calculation is considered of the backscattering coefficient η from a general substrate in the elastic regime. A single dimensionless backscattering parameter is introduced and a simple scaling law is determined, indicating how the configuration of the many variables involved can eventually change without affecting the result. The validity of the law is demonstrated in the 5 to 100 keV energy range, with substrate thicknesses ranging from 10 to 21000A °and for all the substrates of the periodic table.
Tipologia CRIS:
1.1 Articolo in rivista
Elenco autori:
A., Paoletti; Santangelo, Saveria; A., Tucciarone
Autori di Ateneo:
SANTANGELO Saveria
Link alla scheda completa:
https://iris.unirc.it/handle/20.500.12318/4421
Pubblicato in:
MICROELECTRONIC ENGINEERING
Journal
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