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  1. Pubblicazioni

MICROELECTRONIC ENGINEERING

Rivista
Codice:
E109971
ISSN:
0167-9317
  • Dati Generali

Dati Generali

Pubblicazioni (12)

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A single quality factor for electron backscattering from thin films
Articolo
Design and characteristics of a GaAs BMFET
Articolo
Electron scattering effects in additive patterning of XRL masks for 0.2 micron resolution
Articolo
Electron scattering of diamond membranes in x-ray mask fabrication
Articolo
Electron scattering of low-Z high-density materials in X-ray mask patterning
Articolo
Physical approximants to electron scattering
Articolo
Short-range and long-range scattering in electron beam lithography
Articolo
Simulation of 64 megabit lithography in XRL masks obtained by single-layerprocess on Si substrates
Articolo
The generalized backscattering coefficient: a novel parameter in electron scattering processes
Articolo
The role of electron scattering in x-ray reflection-masks
Articolo
Tungsten/carbon masks in x-ray projection lithography
Articolo
X-ray mask making by EBL and Monte Carlo analysis of a single-resist layerprocess on low-Z membrane
Articolo
No Results Found
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