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Electro-optical modulation at 1550 nm in an as-deposited hydrogenated amorphous silicon p-i-n waveguiding device

Articolo
Data di Pubblicazione:
2011
Citazione:
Electro-optical modulation at 1550 nm in an as-deposited hydrogenated amorphous silicon p-i-n waveguiding device / DELLA CORTE, F.G., Rao, S., Coppola, G., Summonte, C.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 19:(2011), pp. 2941-2951. [10.1364/OE.19.002941]
Abstract:
Hydrogenated amorphous silicon (a-Si:H) has been already considered for the objective of passive optical elements, like waveguides and ring resonators, within photonic integrated circuits at λ = 1.55 μm. However the study of its electro-optical properties is still at an early stage, therefore this semiconductor in practice is not considered for light modulation as yet. We demonstrated, for the first time, effective electro-optical modulation in a reverse biased a-Si:H p-i-n waveguiding structure. In particular, phase modulation was studied in a waveguide integrated Fabry-Perot resonator in which the VπLπ product was determined to be 63 Vcm. Characteristic switch-on and switch-off times of 14 ns were measured. The device employed a wider gap amorphous silicon carbide (a-SiC:H) film for the lower cladding layer instead of silicon oxide. In this way the highest temperature involved in the fabrication process was 170°C, which ensured the desired technological compatibility with CMOS processes.
Tipologia CRIS:
1.1 Articolo in rivista
Elenco autori:
DELLA CORTE, Francesco Giuseppe; Rao, S.; Coppola, G.; Summonte, C.
Link alla scheda completa:
https://iris.unirc.it/handle/20.500.12318/7697
Pubblicato in:
OPTICS EXPRESS
Journal
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