XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface

Academic Article

Publication Date:

1996

Short description:

XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface / G., C., R., B., Amoddeo, A., L. S., C., E., C.. - In: APPLIED SURFACE SCIENCE. - ISSN 0169-4332. - 99:(1996), pp. 15-19.

Iris type:

1.1 Articolo in rivista

List of contributors:

G., Chiarello; R., Barberi; Amoddeo, Antonino; L. S., Caputi; E., Colavita

Authors of the University:

AMODDEO Antonino

Handle:

https://iris.unirc.it/handle/20.500.12318/7458

Published in:

APPLIED SURFACE SCIENCE

Journal