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JOURNAL OF ELECTRONIC MATERIALS
Journal
Identifier:
E091577
ISSN:
0361-5235
Overview
Overview
Outputs (6)
Analysis of I–V–T Characteristics of Au/n-InP Schottky barrier diodes with modeling of nanometer-sized patches at low temperature
Academic Article
Analysis of the electrical characteristics of Mo/4H-SiC Schottky barrier diodes for temperature sensing applications
Academic Article
Analysis of the forward I–V characteristics of Al-implanted 4H-SiC p-i-n diodes with modeling of recombination and trapping effects due to intrinsic and doping-induced defect states
Academic Article
Analytical modeling of dual-junction tandem solar cells based on an InGaP/GaAs heterojunction stacked on a Ge substrate
Academic Article
Multiobjective optimization of design of 4H-SiC power MOSFETs for specific applications
Academic Article
Performance analysis of a Pt/n-GaN Schottky barrier UV detector
Academic Article
No Results Found