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JOURNAL OF ELECTRONIC MATERIALS

Rivista
Codice:
E091577
ISSN:
0361-5235
  • Dati Generali

Dati Generali

Pubblicazioni (6)

Analysis of I–V–T Characteristics of Au/n-InP Schottky barrier diodes with modeling of nanometer-sized patches at low temperature
Articolo
Analysis of the electrical characteristics of Mo/4H-SiC Schottky barrier diodes for temperature sensing applications
Articolo
Analysis of the forward I–V characteristics of Al-implanted 4H-SiC p-i-n diodes with modeling of recombination and trapping effects due to intrinsic and doping-induced defect states
Articolo
Analytical modeling of dual-junction tandem solar cells based on an InGaP/GaAs heterojunction stacked on a Ge substrate
Articolo
Multiobjective optimization of design of 4H-SiC power MOSFETs for specific applications
Articolo
Performance analysis of a Pt/n-GaN Schottky barrier UV detector
Articolo
No Results Found
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